What's New
Research & Study
Equipments

 

 

 

 

PLD system with Nd:YAG Laser
for Thinfilm Growth

Max. Laser Intensity : ~2J/§²
Max. Substrate Temp. : 790¡É
Base Pressure : 10¥ìtorr
Available Gases : Oxygen, Nitrogen




Furnace Sets for Sample Growth
for Crystal growth and Sample annealing
Flux, Solid reaction sinterring

Max. Temp : 1400¡É
Temperature controller : K-type, Auto
Available Condition : O©ü, N©ü, H©ü/N©ümixed




Tilted Furnace for Sample Growth
for Crystal growth and Sample annealing
Flux, Vapor, Solid reaction sinterring

Max. Temp : 1400¡É
Temperature controller : K-type, Auto
Available Condition : O©ü, N©ü, H©ü/N©ümixed
Tiled Angle : 0 ~ 90 degree



Hydrothermal system for Nanoparticle
for Nanoparcles synthesis

Components :
   Hydrothermal oven(Max. Temp : 200¡É)
   Ultrasonic, Distilled machine

make a particle using ultrasonic and Hydrothermal



Sealing system
for Vapor Transport and Evacuated quartz tube

Available Condition : Vacuum, Ar, Cl

make a anearobic and volatile sample





Physical Properties Measurement System
for measure Resistivity, Magnetic susceptivility,
Heat capacity, Dielectric Constant, Polarization,
Pyroelectric

Magnetic field range : -9T ~ 9T
Temperature range : -2K ~ 400K
Option : Resistivity, VSM, Cryopump



Electrical Transport Measurement System
for measure Resistivity, Dielectric Constant,
Polarization, Pyroelectric, Striction

Magnetic field range : -1T ~ 1T
Temperature range : -10K ~ 310K (Displaxor)
RT~900¡É(not magnetic field, Hightemp Furnace)




Prove station
for measure Resistivity, Dielectric Constant,
Polarization to Thinfilm

Components : Hot chuck, CCD, Station, Prove
Temperature range : RT ~ 300¡É





Glove Box
for sample synthesis in anaerobic condition

Components :
   Main Box, Pass box, Dry trap,
   Balance, Rotary pump
Available condition : N©ü, H©ü/N©ümixed




Plasma coater










Polarized Microscope with digital camera










Transmission Electron Microscope
in Center for Collaborative Instruments









High resolution X-ray Diffraction eq.
in Center for Collaborative Instruments